In preparation for the beam tests, here is a programme of optimization that I'd like to see once we are operating all the bulk pixels with confidence.  In all, cases, if there is no clear optimum then the nominal value (defined in bias_lookup.doc) should be used.


preShape bulk pixels (preSample pixels inactive):

- Noise vs threshold (for reference at default bias settings)   
    ...select a threshold with some mid-range noise rate
- Noise vs DAC12 (I12_SHAPERBIAS)    ...select an optimum setting
- Noise vs DAC13 (I34_PREBIAS)       ...select an optimum setting
- Noise vs DAC12 (I12_SHAPERBIAS)    ...verify optimum setting
- Noise vs threshold (compared with original case)


preSample bulk pixels (preShape pixels inactive):

- Noise vs threshold (for reference at default bias settings)   
    ...select a threshold with some mid-range noise rate
- Noise vs DAC4 (I34_PREBIAS)    ...select an optimum setting
- Noise vs DAC5 (I34_OUTSFBIAS)  ...select an optimum setting
- Noise vs DAC5 (I34_OUTSFBIAS)  ...select an optimum setting
- Noise vs DAC4 (I34_PREBIAS)    ...verify optimum setting
- Noise vs threshold (compared with original case)


All bulk pixels active

- Noise vs threshold (compared with individually optimized cases)
    ...select a threshold with some mid-range noise rate
- Noise vs DAC6=DAC19 (COMPBIAS1s)  ...select an optimum setting
- Noise vs DAC3=DAC14 (COMPBIAS2s)  ...select an optimum setting


REPEAT ALL THE ABOVE ON A SECOND SENSOR & COMPARE 


Other hardware issues to be looked at (with common set of optimized settings)

- Noise vs threshold (repeat for reference)
- Noise vs threshold by hand - I can hack a board to drive VTH+ & VTH- from an external dual power supply - then take data for a range of dvm recorded threshold settings, and try to reconstruct the full sweep of thresholds - may show whether digital noise on global thresholds has an effect on sensor performace

- Noise vs threshold when driving VRST from an external power supply at 1v

- Noise vs threshold for the three substrate ground options



TRIM ADJUSTMENT OF EACH SENSOR TO BE USED; IDENTIFY AND MASK BAD PIXELS