Lot Number:		10
	Lot Identifier:		A2D26000N5
	Received at IC:		15/7/03
	Wafer Number	Wafer Identifier	Number of good die	Yield (%)	Location	Comments	QA tests status
	1	KJM6TWT	248	69	Hybrid SA		SCR - Irr at IC (1 die)
	2	KCM6UKT	312	87	Hybrid SA		SCR - Irr at IC (1 die)
	3	K5M70NT	264	73	Hybrid SA		SCR - Irr at IC (1 die)
	4	KMM6TTT	285	79	Hybrid SA		SCR - Irr at IC (1 die)
	5	KSM6W4T	297	83	Hybrid SA		SCR - Irr at IC (1 die)
	6	KDM6ZZT	313	87	Hybrid SA		SCR
	7	K0M6TFT	315	88	Hybrid SA		SCR
	8	K5M6V9T	323	90	Hybrid SA		SCR
	9	KHM6TYT	231	64	Imperial
	10	KZM6UYT	249	69	Hybrid SA		SCR
	11	KQM6XNT	301	84	Hybrid SA		SCR
	12	KGM6VYT	297	83	Hybrid SA		SCR
	13	KEM6XZT	263	73	Hybrid SA		SCR
	14	KYM70VT	298	83	Hybrid SA		SCR
	15	KQM6VPT	314	87	Hybrid SA		SCR
	16	KXM6U0T	316	88	Hybrid SA		SCR
	17	K5M6TAT	239	66	Hybrid SA		SCR
	18	KNM705T	281	78	Hybrid SA		SCR - Pado for Irr (1 die)
	19	KIM6TXT	300	83	Hybrid SA		SCR - Pado for Irr (1 die)
	20	KMM6W9T	340	94	Hybrid SA		SCR - Pado for Irr (1 die)
	21	KKM6VUT	328	91	Hybrid SA		SCR - Pado for Irr (1 die)
	22	KUM6W2T	325	90	Hybrid SA		SCR - Pado for Irr (1 die)
	23
	24
	25
	Total good die:			6439
	Average yield for this lot:			81			Irr: irradiated at 10Mrad
	Highest yield:			94			SCR: Sample Chip Returned
	Lowest yield:			64			Ann: Annealed