Lot Number:		12
	Lot Identifier:		A2D34000N5
	Received at IC:		Sept'03
	Wafer Number	Wafer Identifier	Number of good die	Yield (%)	Location	Comments	QA test plans
	1	KQM6Y5T	206	57	Hybrid SA	SCR
	2	K0M6XDT	270	75	Hybrid SA	SCR	1 chip to Padova
	3	K3M6XAT	284	79	Hybrid SA	SCR
	4	K8M6WNT	262	73	Hybrid SA	SCR
	5	K7M6V7T	291	81	Hybrid SA	SCR
	6	KWM6XHT	288	80	Hybrid SA	SCR
	7	K9M6X4T	281	78	Hybrid SA	SCR
	8	KJM6UDT	297	83	Hybrid SA	SCR (1 chip only)
	9	KBM6WKT	297	83	Hybrid SA	SCR
	10	K9M6UNT	302	84	Hybrid SA	SCR
	11	KCM6X1T	310	86	Hybrid SA	SCR
	12	K5M6X8T	309	86	Hybrid SA	SCR
	13	K9M6Z3T	300	83	Hybrid SA	SCR
	14	KFM6XYT	264	73	Hybrid SA	SCR
	15	KTM6ZJT	284	79	Hybrid SA	SCR
	16	KNM6Y7T	265	74	Hybrid SA	SCR	1 chip to Padova
	17	K7M6UQT	297	83	Hybrid SA	SCR
	18	KYM6YXT	296	82	Hybrid SA	SCR	1 chip to Padova
	19	K7M6YNT	311	86	Hybrid SA	SCR	1 chip to Padova
	20	KUM6ZIT	293	81	Hybrid SA	SCR
	21	KAM6X3T	270	75	Hybrid SA	SCR
	22	K6M6YPT	296	82	Hybrid SA	SCR	1 chip to Padova
	Total good die:			6273			SCR=sample chip returned
	Average yield for this lot:			79			Irr: irradiated at 10Mrad
	Highest yield:			86
	Lowest yield:			57