Lot Number:		15
	Lot Identifier:		A2D34002N5
	Received at IC:		October 2003
	Wafer Number	Wafer Identifier	Number of good die	Yield (%)	Location	Comments	QA test plans
	1	D9KSJUT	301	84	Hybrid SA	3 SCR
	2	DZKSJ4T	305	85	Hybrid SA	3 SCR
	3	DSKQMUT	319	89	Hybrid SA	3 SCR
	4	D2KSH2T	331	92	Hybrid SA	3 SCR
	5	DGKSHNT	332	92	Hybrid SA	3 SCR	1 chip Irr@IC
	6	DPKQLFT	307	85	Hybrid SA	3 SCR
	7	DZKQPLT	330	92	Hybrid SA	3 SCR
	8	DSKQLCT	319	89	Hybrid SA	3 SCR
	9	D6KQGIT	329	91	Hybrid SA	3 SCR
	10	D3KQGLT	334	93	Hybrid SA	3 SCR
	11	D4KQGKT	324	90	Hybrid SA	3 SCR
	12	D2KQPIT	334	93	Hybrid SA	3 SCR
	13	DLKQFLT	317	88	Hybrid SA	3 SCR
	14	DNKSGZT	325	90	Hybrid SA	3 SCR
	15	D0KQN3T	341	95	Hybrid SA	4 SCR *
	16	DZKQQ3T	331	92	Hybrid SA	3 SCR
	17	D1KQPJT	338	94	Hybrid SA	3 SCR
	18	DLKSI0T	334	93	Hybrid SA	3 SCR
	19	DQKSJDT	336	93	Hybrid SA	3 SCR	1 chip Irr@Padova
	20	DHKSJLT	331	92	Hybrid SA	3 SCR
	21	DYKSINT	329	91	Hybrid SA	3 SCR
	22	DDKSHRT	337	94	Hybrid SA	3 SCR	1 chip Irr@Padova
	23	DAKSIBT	323	90	Hybrid SA	3 SCR
	24	DFKSHPT	336	93	Hybrid SA	3 SCR	1 chip Irr@IC
	Total good die:			7843		SCR discrepancies * 4 chips returned for this wafer (according to documentation), 2 with same identity (9,10). So expect (24x3)+1 SCR = 73 chips, but only 71 chips returned altogether
	Average yield for this lot:			91
	Highest yield:			95
	Lowest yield:			84