Lot Number:		16
	Lot Identifier:		A2D35001N5
	Received at IC:		October 2003
	Wafer Number	Wafer Identifier	Number of good die	Yield (%)	Location	Comments	QA test plans
	1	D7KPRDT	331	92	Hybrid SA	SCR
	2	DPKPTVT	326	91	Hybrid SA	SCR	1 chip -> Irr @ Padova
	3	DTKPU8T	337	94	Hybrid SA	SCR
	4	DGKPR4T	341	95	Hybrid SA	SCR
	5	DVKPU6T	344	96	Hybrid SA	SCR
	6	DZKPRLT	328	91	Hybrid SA	SCR
	7	DEKPQPT	307	85	Hybrid SA	SCR	1 chip - > Irr @ Padova
	8	DCKPQRT	330	92	Hybrid SA	SCR
	9	DHKPR3T	340	94	Hybrid SA	SCR
	10	DXKPU4T	338	94	Hybrid SA	SCR
	11	DTKPRST	326	91	Hybrid SA	SCR
	12	DNKPUDT	329	91	Hybrid SA	SCR
	13	D7KPQWT	333	93	Hybrid SA	SCR	1 chip -> Irr @ IC
	14	DPKPQET	328	91	Hybrid SA	SCR
	15	DZKPU2T	327	91	Hybrid SA	SCR
	16	DMKPUET	320	89	Hybrid SA	SCR
	17	DUKPU7T	345	96	Hybrid SA	SCR	1 chip -> Irr @ IC
	18	DLKPTYT	339	94	Hybrid SA	SCR
	19	D3KPRHT	331	92	Hybrid SA	SCR
	20	DVKPTPT	322	89	Hybrid SA	SCR
	21	DQKPURT	332	92	Hybrid SA	SCR but not identified in documentation
	22	D8KPQVT	316	88	Hybrid SA	SCR
	23	DAKPRAT	320	89	Hybrid SA	SCR
	24	D4KPRGT	301	84	Hybrid SA	SCR
	Total good die:			7891
	Average yield for this lot:			91
	Highest yield:			96
	Lowest yield:			84