Lot Number:		4
	Lot Identifier:		A2C17000N5
	Received at IC:		20th May 2002
	Wafer Number	Wafer Identifier	Number of good die	Yield (%)	Location	Comments	QA Tests Status
	1	W88P2LT	120	33	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die)
	2	W98P2KT	104	29	Hybrid SA (Feb 03)	1 KGD returned (05/04)*	SCR - Irr at IC (1 die)
	3	W98P4JT	65	18	Hybrid SA (Feb 03)	2 KGD returned (05/04)*	SCR - Irr at IC (1 die)
	4	WA8P2JT	114	32	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die)
	5	WA8P7ZT	106	29	Hybrid SA (Feb 03)		SCR - Irr & Rel at IC (1 die)
	6	WB8P4HT	126	35	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die)
	7	WB8P5ZT	112	31	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die)
	8	WB8P7YT	25	7	Hybrid SA (Feb 03)	2 KGD returned (05/04)*	SCR - Irr & Rel at IC (1 die)
	9	WD8P3YT	114	32	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die)
	10	WE8P3XT	136	38	Hybrid SA (Feb 03)		SCR - Irr & Rel at IC (1 die) - Irr & Ann in Pado (1)
	11	WF8P3WT	96	27	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die)
	12	WF8P6CT	93	26	Hybrid SA (Feb 03)		SCR - Irr & Rel at IC (1 die)
	13	WG8P3VT	119	33	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die) - Irr & Ann in Pado (1)
	14	WG8P4CT	3	1	Burlington for APV yield investigations (Feb 03)
	15	WH8P3UT	80	22	Hybrid SA (Feb 03)	14 KGD returned (05/04)*
	16	WJ8P3ST	114	32	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die) - Irr & Ann in Pado (1)
	17	WK8NVWT	103	29	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die)
	18	WM8P3PT	131	36	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die) - Irr & Ann in Pado (1)
	19	WN8P3NT	125	35	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die) - Irr & Ann in Pado (1)
	20	WP8P3MT	119	33	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die) - Irr & Ann in Pado (1)
	21	WQ8P3LT	91	25	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die)
	22	WR8P3KT	93	26	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die)
	23	WT8P3IT	136	38	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die)
	24	WU8P3HT	125	35	Hybrid SA (Feb 03)	2 KGD returned (05/04)*	SCR - Irr at IC (1 die)
	25	WZ8P6TT	82	23	Hybrid SA (Feb 03)		SCR - Irr at IC (1 die)
	Total number of good die is			2532		* returned together with some KGD from lot 3. 73 chips listed (and identified here) but only 67 sent so a discrepancy of 6 exists	Irr: irradiated at 10Mrad
	Average yield for this lot is			28			Rel: reliability (temp cycling)
	Highest yield is			38			Ann: Annealed
	Lowest yield is			1			SCR: Sample Chip Returned