Lot Number:		5
	Lot Identifier:		A2C19Q00N5
	Received at IC:		29th May 2002
	Wafer Number	Wafer Identifier	Number of good die	Yield (%)	Location	Comments	QA Tests Status
	1	W08P6ST	172	48	Hybrid SA (Feb 03)		SCR - Irr & Ann in Pado (1 die)
	2	W08P79T	162	45	Hybrid SA (Feb 03)		SCR - Irr & Ann in Pado (1 die)
	3	W18P78T	162	45	Hybrid SA (Feb 03)		SCR - Irr & Ann in Pado (1 die)
	4	W28P6QT	131	36	Hybrid SA (Feb 03)		SCR - Irr & Ann in Pado (1 die)
	5	WG8P6BT	175	49	Hybrid SA (Feb 03)		SCR - Irr & Ann in Pado (1 die)
	6	WI8P69T	149	41	Hybrid SA (Feb 03)		SCR - Irr & Ann in Pado (1 die)
	7	WJ8P68T	157	44	Hybrid SA (Feb 03)		SCR - Irr & Ann in Pado (1 die)
	8	WK8P67T	162	45	Hybrid SA (Feb 03)		SCR - Irr & Ann in Pado (1 die)
	9	WK8P86T	159	44	Hybrid SA (Feb 03)		SCR - Irr & Ann in Pado (1 die)
	10	WL8P66T	153	43	Hybrid SA (Feb 03)		SCR - Irr & Ann in Pado (1 die)
	11	WM8P65T	256	71	Hybrid SA (Feb 03)		SCR - Irr & Ann at IC (1 die)
	12	WN8P64T	144	40	Hybrid SA (Feb 03)		SCR - IC for Irr (1 die)
	13	WR8P7IT	176	49	Hybrid SA (Feb 03)		SCR - Irr & Ann at IC (1 die)
	14	WS8NQ9T	142	39	Hybrid SA (Feb 03)		SCR - Irr & Ann at IC (1 die)
	15	WS8P7HT	152	42	Hybrid SA (Feb 03)		SCR - Irr & Ann at IC (1 die)
	16	WU8P7FT	23	6	Hybrid SA (Feb 03)		SCR
	17	WV8P7ET	174	48	Hybrid SA (Feb 03)		SCR
	18	WX8P7CT	173	48	Hybrid SA (Feb 03)		SCR
	19	WY8P7BT	167	46	Hybrid SA (Feb 03)		SCR
	20	WZ8P7AT	123	34	Hybrid SA (Feb 03)		SCR
	21	W28P77T	133	37	Burlington for APV25 yield investigations (Feb 03)	Wafers received at IC in March 03
	22	WS8P5IT	144	40	Imperial College
	23	WH8P6AT	104	29	Imperial College
	24
	25
	Total number of good die is			3493			Irr: irradiated at 10Mrad
	Average yield for this lot is			42			SCR: Sample Chip Returned
	Highest yield is			71			Ann: Annealed
	Lowest yield is			6