Lot Number:		9
	Lot Identifier:		A2D25000N5
	Received at IC:		June 2003
	Wafer Number	Wafer Identifier	Number of good die	Yield (%)	Location	Comments	QA Tests Status
	1	L122PCT	334	93	Hybrid SA		SCR - Pado for Irr (1 die)
	2	LX22PGT	306	85	Hybrid SA		SCR - Pado for Irr (1 die)
	3	L022MET	329	91	Hybrid SA		SCR - IC for Irr (1 die)
	4	LU22S0T	308	86	Hybrid SA		SCR - Pado for Irr (1 die)
	5	LU22Q1T	319	89	Hybrid SA		SCR - IC for Irr (1 die)
	6	LR22Q4T	335	93	Hybrid SA		SCR - IC for Irr (1 die)
	7	LQ22Q5T	314	87	Hybrid SA		SCR - IC for Irr (1 die)
	8	LD22RZT	322	89	Hybrid SA		SCR - IC for Irr (1 die)
	9	LA22M4T	327	91	Hybrid SA		SCR - IC for Irr (1 die)
	10	L322PAT	326	91	Hybrid SA		SCR - Pado for Irr (1 die)
	11	L122RBT	318	88	Hybrid SA		SCR - Pado for Irr (1 die)
	12	LX22MHT	312	87	Hybrid SA		SCR - Pado for Irr (1 die)
	13	L022RCT	319	89	Hybrid SA		SCR - IC for Irr (1 die)
	14	LN22Q7T	326	91	Hybrid SA		SCR - IC for Irr (1 die)
	15	LZ22PET	332	92	Hybrid SA		SCR - Pado for Irr (1 die)
	16	L122MDT	326	91	Hybrid SA		SCR - Pado for Irr (1 die)
	17	LP22Q6T	309	86	Hybrid SA		SCR - IC for Irr (1 die)
	18	LW22MIT	336	93	Hybrid SA		SCR - Pado for Irr (1 die)
	19	LS22RKT	330	92	Hybrid SA		SCR - IC for Irr (1 die)
	20
	21
	22
	23
	24
	25
	Total good die:			6128			Irr: irradiated at 10Mrad
	Average yield for this lot:			90			SCR: Sample Chip Returned
	Highest yield:			93
	Lowest yield:			85